Showing 3 results for Crystallite Size
A. Rezvanifar, M. Zandrahimi,
Volume 7, Issue 1 (3-2010)
Abstract
Abstract:
powerful method for the characterization of microstructures of crystalline materials in terms of crystallite size and
dislocation structures. In this paper the effect of the sliding on the microstructure of A356 in the as-cast and heat
treated conditions are studied, The X-ray phase analysis shows that with increasing applied load, the dislocation
density is increased, whereas the crystallite size is decreased. It was found that heat treatment raised dislocation
density during wear. The screw or edge character of dislocations in worn specimens were determined by analyzing the
dislocation contrast factors, it was demonstrated that the character of the prevailing dislocations in high loads is
nearly pure screw.
Diffraction peak profile analysis has recently been developed to such an extent that it can be applied as a
Mala Siddaramappa, Haraluru Kamala Eshwaraiah Latha, Haraluru Shankaraiah Lalithamba, Andi Udayakumar,
Volume 18, Issue 4 (12-2021)
Abstract
Indium tin oxide (ITO) nanoparticles were synthesized by green combustion method using indium (In) and tin (Sn) as precursors, and Carica papaya seed extract as novel fuel. This paper highlights effect of tin concentration (5%, 10% and 50%) on microstructural, optical and electrical properties of ITO nanoparticles (NPs). The indium nitrate and tin nitrate solution along with the fuel were heated at 600 °C for 1 h in muffle furnace and obtained powder was calcinated at 650 °C for 3 h to produce ITO NPs. The above properties were investigated using XRD, FTIR, UV-Vis spectroscopy, SEM, TEM and computer controlled impedance analyser. The XRD, SEM and TEM investigations reveals the synthesized NPs were spherical in shape with an increase in average grain size (17.66 to 35 nm) as Sn concentration increases. FTIR investigations confirms the In-O bonding. The optical properties results revealed that the ITO NPs band gap decreased from 3.21 to 2.98 eV with increase in Sn concentration. The ac conductivity of ITO NPs was found to increase with increase in Sn concentration. These synthesised ITO NPs showed the excellent properties for emerging sensor and optical device application.
Ahmed Kharmouche,
Volume 22, Issue 1 (3-2025)
Abstract
Series of cobalt (Co) thin films with various thicknesses ranging from 50 to 400 nm have been fabricated using thermal heating under vacuum. We explore the impact of the thickness layer on the structural and morphological properties of the films. X-Ray diffractions and atomic force microscopy tools have been used to carry out the structural and the morphological properties of these films. The films are principally c-axis oriented, polycrystalline and with <0001> texture. The crystallites sizes have been found to range from 18.40 to 79.46 nm, and they increase with increasing thickness. The ratio c/a value indicates that Co films are subject to a tensile stress, probably because of the way the film grows. The microstrain is positive and ranges from 1.53 to 3.56%. Atomic force microscopy observations indicate the formation of crystallites according to the Stranski-Krastanov mode. The films topographical surfaces are very smooth, the average root mean square roughness ranging from 0.2 to 1.5 nm.
Keywords: Co; Thin films; XRD; Crystallite size; AFM.
