Volume 3, Issue 1 (Oct 2006)                   IJMSE 2006, 3(1): 9-15 | Back to browse issues page

XML Print

Download citation:
BibTeX | RIS | EndNote | Medlars | ProCite | Reference Manager | RefWorks
Send citation to:
ALAEE M.S.. MICROSTRUCTURAL STUDY OF SILICON NITRIDE WHISKERS PRODUCED BY NITRIDATION OF PLASMA-SPRAYED SILICON LAYERS. IJMSE 2006; 3 (1) :9-15
URL: http://ijmse.iust.ac.ir/article-1-79-en.html
MICROSTRUCTURAL STUDY OF SILICON NITRIDE WHISKERS PRODUCED BY NITRIDATION OF PLASMA-SPRAYED SILICON LAYERS
ALAEE M.S.
Abstract:   (28426 Views)
plasma-sprayed silicon layers have been used to produce silicon nitride layers with fibrous microstructure which optimizes fracture toughness and strength. SEM examination of the specimens shows that the surface is covered by fine needles and whiskers of Si3N4.In order to study the oxygen contamination effect as well as other contaminants introduced during spraying and nitridation processes, surface sensitive analysis techniques like AES and XPS have been used to determine concentration of these contaminants.
Keywords: PLASMA SPRAY, SILICON NITRIDE, CONTAMINATION. WHISKERS, SURFACE ANALYSIS, MICROSTRUCTURE
     
Type of Study: Research Paper | Subject: Ceramics
Add your comments about this article : Your username or Email:
CAPTCHA
Rights and permissions
Creative Commons License This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.

© 2022 All Rights Reserved | Iranian Journal of Materials Science and Engineering

Designed & Developed by : Yektaweb